By Dr. Ashish Vasant Joglekar, Member of Technical Staff (Hardware Design), Robert Bosch Center for Cyber Physical Systems, IISc
This talk aims to encourage engineers to make EMI/EMC considerations during early stages of a product’s design cycle. Today, there is a need for ubiquitous sensor deployment in uncontrolled environments (e.g IoT for Smart Cities Infrastructure). This is also an age of miniaturization (e.g. Wearables). In this talk, we will see how these trends require a design that is EM complaint to preserve the accuracy of sensor data. We start with the applicable regulatory framework for EM complaince in India. Next we look at a typical EMI Noise Path model. The first step is to identify the possible sources of EM noise and possible victims. EMI problem can be intrasystem with source and victim as part of same circuit or intersystem with distinct source circuits and victim circuits. A typical Embedded Data Acquisition System will be used as a example. We will identify the sources of both inter and intra system EMI in this system and propose mitigation strategies to achieve EM complaince.
- Identify the fundamental sources of EM noise.
- Gain knowledge about techniques to mitigate EMI to achieve EM complaince.
- Improve accuracy of sensor data.
Dr. Ashish Vasant Joglekar received his Ph.D. degree in 2015 from Department of Electronic Systems Engineering, Indian Institute of Science (IISc), Bangalore, India. His Ph.D. thesis was titled ”Design and practical implementation of novel, low cost, commercially viable Active EMI filters for mitigation of conducted EMI in switched mode power converters”. Currently he is working as a Member of Technical Staff (Hardware Design) at the Robert Bosch Center for Cyber Physical Systems, IISc. His research interests include Design for Electromagnetic Compatibility, Analog Front-End design, Switched Mode Power Converters and Active EMI Filters.
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